Nanomaterials Core Characterization Facility

M-2000 J.A.Woollam Spectroscopic Ellipsometer

M-2000 J.A.Woollam Spectroscopic Ellipsometer [View Image]

The M-2000 ellipsometer is able to collect data across the entire 250– 1700 nm range with about 2 nm resolution. Combined with automated sample alignment, customizable computer controlled X-Y mapping, and focusing probes for small samples, users are able to determine the thickness of thin films and a complex optical function in the ultraviolet, visible, and near infrared spectral ranges.

  • Spectral Range 250– 1700 nm
  • Typical data acquisition times 1-5 sec
  • Collimated light beam
  • Focusing optics options
  • Auto angle base ranging 45° to 90°, horizontal sample stage
  • Automated sample height (Z) alignment, and tilt alignment
  • Automated Sample Translation, 200 x 200 mm XY Mapping
  • Transmission Mount, holds samples up to 150 mm diameter
  • CompleteEASE software for data acquisition & analysis

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